8.8. Drop test-跌落测试

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8.8.1 A device with a polymeric enclosure shall be subjected to the tests described in Clauses 8.8.2 and8.8.3. There shall be no damage to the enclosure making uninsulated live parts or internal wiringaccessible to contact or defeating the mechanical protection of internal parts of the equipment afforded bythe enclosure. For adapters, the test is conducted since it is assumed the user would replace the lamp.For self-ballasted lamps the test is done because the lamp could be damaged, but it would not be obvious,for example if the lamp is enclosed
装置应接受第8.8.2和8.8.3条所述的试验，在试验中，不应损伤罩壳，导致非绝缘带电零件或内部接线可被触及或破坏设备内部零件的机械绝缘。

8.8.2 A device shall be subjected to the impact test as follows:a) A device shall be dropped 0.91 m (3 ft) striking a hardwood surface in the position mostlikely to produce adverse results. The hardwood surface shall consist of a layer of nominal 25mm (1 in) thick tongue-and-groove oak flooring mounted on two layers of nominal 19 mm (3/4in) thick plywood. The assembly shall rest on a concrete floor or an equivalent non-resilient floorduring the test.
b) A device shall be dropped three times so that, in each drop, the sample strikes the surfacein a position different from those in the other two drops
设备应进行下列冲击试验：
a）装置从 0.91m（3 英尺）的高度跌落在一硬木板上。硬木板由标称 25mm（1 英寸）厚的企口板安装在二层标称厚度为 19mm（3/4 英寸）的夹板上构成。将木板放在混凝土地面上或类似无弹性地面上。
b）装置如此跌落 3 次，每次跌落的冲击点应不同。

8.8.3 A device having accessible non-current-carrying metal parts that could be energized from withinshall subsequently be subjected to the dielectric voltage-withstand test of Clause 8.6. There shall be nobreakdown as a result of the dielectric voltage-withstand test. There shall be no damage to the enclosuremaking uninsulated live parts or internal wiring accessible to contact, which is determined using thearticulate probe described in Figure 9.3, or defeating the mechanical protection of internal parts of theequipment afforded by the enclosure.8.8.4 Accessibility criteria are not applied for broken lamps
然后，带金属罩壳的装置应经受第 8.6 章中介电耐压试验。在试验中不得出现击穿现象。罩壳不得破损至非绝缘带电零件或内部接线暴露出来且可被图 9.3中试验探针触及，或破坏设备内部零件的机械绝缘。